Document Type

Article

Original Publication Date

2005

Journal/Book/Conference Title

Applied Physics Letters

Volume

86

Issue

26

DOI of Original Publication

10.1063/1.1968432

Comments

Originally published at http://dx.doi.org/10.1063/1.1968432

Date of Submission

April 2015

Abstract

We measured pseudodielectric functions in the visible-ultraviolet spectral range of Pb(ZrxTi1−x)O3 (x=0.2, 0.56, 0.82) (PZT)grown on platinized silicon substrate using the sol-gel method and also on (0001) sapphire using radio frequency sputtering method. Using a parametric optical constant model, we estimated the dielectric functions of the PZTthin films. Taking the second derivative of the fitted layer dielectric functions and using the standard critical point model, we determined the parameters of the critical points. In the second derivative spectra, the lowest bandgap energy peak near 4eV is fitted as a double peak for annealedPZTs associated with the perovskite phase. As-grown PZTs have mainly pyrochlore phase and the lowest bandgap is fitted as a single peak. We compared the bandgap energies with literature values.

Rights

Lee, H., Kang, Y.S., Cho, S.-J., et al. Visible-ultraviolet spectroscopic ellipsometry of lead zirconate titanate thin films. Applied Physics Letters, 86, 262902 (2005). Copyright © 2005 AIP Publishing LLC.

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VCU Electrical and Computer Engineering Publications

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