Document Type

Article

Original Publication Date

2008

Journal/Book/Conference Title

Journal of Nanomaterials

Volume

2008

Issue

Article ID 682920, 4 pages

DOI of Original Publication

10.1155/2008/682920

Comments

Originally published at http://dx.doi.org/10.1155/2008/682920.

Date of Submission

August 2014

Abstract

The field emission properties of LaS nanoprotrusions called nanodomes, formed by pulsed laser deposition on porous anodic alumina films, have been analyzed with scanning anode field emission microscopy. The voltage necessary to produce a given field emission current is 3.5 times less for nanodomes than for thin films. Assuming the same work function for LaS thin films and nanoprotrusions, that is, 1 eV, a field enhancement factor of 5.8 is extracted for the nanodome emitters from Fowler-Nordheim plots of the field emission data. This correlates well with the aspect ratio of the tallest nanodomes observed in atomic force micrograph measurements.

Rights

Copyright © 2008 V. Semet et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Is Part Of

VCU Electrical and Computer Engineering Publications

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