Systematic measurement of AlxGa1−xN refractive indices

Authors

Ü. Özgür, Duke UniversityFollow
Grady Webb-Wood, Duke University
Henry O. Everitt, Duke University
Feng Yun, Virginia Commonwealth University
Hadis Morkoç, Virginia Commonwealth UniversityFollow

Document Type

Article

Original Publication Date

2001

Journal/Book/Conference Title

Applied Physics Letters

Volume

79

Issue

25

DOI of Original Publication

10.1063/1.1426270

Comments

Originally published at http://dx.doi.org/10.1063/1.1426270

Date of Submission

April 2015

Abstract

Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic AlxGa1−xNepitaxial layers with 0.0⩽x⩽1.0 throughout the visible wavelength region. The dispersion, measured by a prism coupling waveguide technique, is found to be well described by a Sellmeier relation. Discrepancies among previous measurements of refractive indexdispersion, as a consequence of different growth conditions and corresponding band gap bowing parameter, are reconciled when the Sellmeier relation is parameterized not by x but by band gapenergy.

Rights

Özgür, Ü., Webb-Wood, G., Everitt, H.O., et al. Systematic measurement of AlxGa1−xN refractive indices. Applied Physics Letters, 79, 4103 (2001). Copyright © 2001 AIP Publishing LLC.

Is Part Of

VCU Electrical and Computer Engineering Publications