Original Publication Date
Applied Physics Letters
DOI of Original Publication
Date of Submission
Dispersion of the ordinary and extraordinary indices of refraction have been measured systematically for wurtzitic AlxGa1−xNepitaxial layers with 0.0⩽x⩽1.0 throughout the visible wavelength region. The dispersion, measured by a prism coupling waveguide technique, is found to be well described by a Sellmeier relation. Discrepancies among previous measurements of refractive indexdispersion, as a consequence of different growth conditions and corresponding band gap bowing parameter, are reconciled when the Sellmeier relation is parameterized not by x but by band gapenergy.
Özgür, Ü., Webb-Wood, G., Everitt, H.O., et al. Systematic measurement of AlxGa1−xN refractive indices. Applied Physics Letters, 79, 4103 (2001). Copyright © 2001 AIP Publishing LLC.
Is Part Of
VCU Electrical and Computer Engineering Publications