Document Type
Article
Original Publication Date
2006
Journal/Book/Conference Title
Journal of Applied Physics
Volume
100
Issue
11
DOI of Original Publication
10.1063/1.2392995
Date of Submission
November 2015
Abstract
The third-order nonlinear optical susceptibility of indium tin oxide (ITO) thin films on glass substrates, χ(3)ITO, was determined in the near-IR spectral region using degenerate four wave mixing (DFWM)spectroscopy with 100fs laser pulses. A DFWM method for measuring thin films on thick substrates was refined for the characterization of films less than 100nm thick and applied to ∼25nm thick ITO films. It was found that χ(3)ITO is purely electronic at 900–1300nm (11000–7700cm−1) and has a value of (2.16±0.18)×10−18m2V−2. Theχ(3)ITO value reaches (3.36±0.28)×10−18m2V−2 at 1500nm (6700cm−1) due to two-photon absorption by free carriers (electrons). Ultrafast electron relaxation was also observed. The ∼100fs lifetime of this process could reflect electron scattering in the conduction band.
Rights
Humphrey, J. L., and Kuciauskas, D. Optical susceptibilities of supported indium tin oxide thin films. Journal of Applied Physics, 100, 113123 (2006). Copyright © 2006 American Institute of Physics.
Is Part Of
VCU Chemistry Publications
Comments
Originally published at http://dx.doi.org/10.1063/1.2392995