Document Type

Article

Original Publication Date

2006

Journal/Book/Conference Title

Applied Physics Letters

Volume

88

Issue

7

DOI of Original Publication

10.1063/1.2166478

Comments

Originally published at http://dx.doi.org/10.1063/1.2166478

Date of Submission

April 2015

Abstract

Gallium (Ga) surfacedesorption behavior was investigated using reflection high-energy electron diffraction during the GaNgrowth. It was found that the desorption of Ga atoms from the (0001) GaNsurfaces under different III-V ratio dependents on the coverage of adsorbed atoms. Doing so led to desorption energies of 2.76 eV for Ga droplets, 1.24–1.89 eV for Ga under Ga-rich growth conditions, and 0.82 eV – 0.94 eV for Ga under stoichiometric growth conditions. Moreover, the variation of the GaNsurface morphology under different III-V ratios on porous templates supports the conclusion that Ga desorption energy depends on the coverage, and the III/V ratio dominates the growth mode.

Rights

He, L., Moon, Y.-T., Xie, J., et al. Gallium desorption kinetics on (0001) GaN surface during the growth of GaN by molecular-beam epitaxy. Applied Physics Letters, 88, 071901 (2006). Copyright © 2006 AIP Publishing LLC.

Is Part Of

VCU Electrical and Computer Engineering Publications

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