"Reduced auger recombination in mid-infrared semiconductor lasers" by Robert Bedford, Gregory Edward Triplett et al.
 

Document Type

Article

Original Publication Date

2011

Journal/Book/Conference Title

Journal of Applied Physics

Volume

110

DOI of Original Publication

doi:10.1063/1.3646552

Date of Submission

March 2018

Abstract

A quantum-design approach to reduce the Auger losses in two micron InGaSb type-I quantum well edge-emitting lasers is reported. Experimentally realized structures show a 3X reduction in the threshold, which results in 4.6 lower Auger current loss at room temperature. This is equivalent to a carrier lifetime improvement of 5.7 and represents about a 19-fold reduction in the equivalent “Auger coefficient.”

Is Part Of

VCU Electrical and Computer Engineering Publications

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