Document Type

Article

Original Publication Date

2000

Journal/Book/Conference Title

Applied Physics Letters

Volume

76

Issue

20

DOI of Original Publication

10.1063/1.126507

Comments

Originally published at http://dx.doi.org/10.1063/1.126507

Date of Submission

April 2015

Abstract

Electronic Raman scattering experiments have been carried out on both molecular beam epitaxy and metal-organic chemical vapor deposition-grown Mg-doped wurtzite GaN samples. Aside from the expected Raman lines, a broad structure (full width at half maximum≅15 cm−1)observed at around 841 cm−1 is attributed to the electronic Raman scattering from neutral Mg impurities in Mg-doped GaN. Our experimental results demonstrate that the energy between the ground and first excited states of Mg impurities in wurtzite GaN is about one-half of its binding energy.

Rights

Tsen, K.T., Koch, C., Chen, Y., et al. Observation of electronic Raman scattering from Mg-doped wurtzite GaN. Applied Physics Letters, 76, 2889 (2000). Copyright © 2000 AIP Publishing LLC.

Is Part Of

VCU Electrical and Computer Engineering Publications

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