Document Type
Article
Original Publication Date
2005
Journal/Book/Conference Title
Physical Review B
Volume
72
Issue
4
DOI of Original Publication
10.1103/PhysRevB.72.045304
Date of Submission
May 2015
Abstract
Modulated electroreflectance spectroscopy Delta R/R of semiconductor self-assembled quantum dots is investigated. The structure is modeled as dots with lens shape geometry and circular cross section. A microscopic description of the electroreflectance spectrum and optical response in terms of an external electric field (F) and lens geometry have been considered. The field and lens symmetry dependence of all experimental parameters involved in the Delta R/R spectrum have been considered. Using the effective mass formalism the energies and the electronic states as a function of F and dot parameters are calculated. Also, in the framework of the strongly confined regime general expressions for the excitonic binding energies are reported. Optical selection rules are derived in the cases of the light wave vector perpendicular and parallel to F. Detailed calculation of the Seraphin coefficients and electroreflectance spectrum are performed for the InAs and CdSe nanostructures. Calculations show good agreement with measurements recently performed on CdSe/ZnSe when statistical distribution on size and shape are considered, explaining the main observed characteristic in the electroreflectance spectra.
Rights
Rodríguez, A.H., Trallero-Giner, C., Muñoz, M. Electroreflectance spectroscopy in self-assembled quantum dots: lens symmetry. Physical Review B, 72, 045304 (2005). Copyright © 2005 American Physical Society.
Is Part Of
VCU Physics Publications
Comments
Originally published by the American Physical Society at: http://dx.doi.org/10.1103/PhysRevB.72.045304